An Event-Driven System-Level Noise Analysis Methodology for RF Systems.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
A Fast and Accurate True Event-driven Phase Locked Loop Model.
Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020
Modeling Power Supply Noise Effects for System-Level Simulation of $\Delta\Sigma$ -ADCs.
Proceedings of the 16th International Conference on Synthesis, 2019
Baseband Equivalent Modelling Approach for Analog Linear Transfer Functions in Event-driven Simulations.
Proceedings of the 16th International Conference on Synthesis, 2019
A 32 MHz Crystal Oscillator with Fast Start-Up Using Dithered Injection and Negative Resistance Boost.
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Proceedings of the 45th IEEE European Solid State Circuits Conference, 2019
Advanced Modeling Methodology for Expedient RF SoC Verification and Performance Estimation.
Proceedings of the 15th International Conference on Synthesis, 2018
A multistandard, triple band wireless transceiver in a 130 nm CMOS technology with integrated PAs for IoT applications.
Proceedings of the 2018 IEEE Radio and Wireless Symposium, 2018
An O-QPSK modem using an FSK RF front end for IEEE 802.15.4 operation providing Maximum-Likelihood data.
Proceedings of the 2018 International Conference on Computing, 2018
Methodology for improved event-driven system-level simulation of an RF transceiver subsystem for wireless SoCs.
Proceedings of the 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2018
AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
Novel metrics for Analog Mixed-Signal coverage.
Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017
Embedded tutorial: Analog-/mixed-signal verification methods for AMS coverage analysis.
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Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016