2017
In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM).
[DOI]
Renuka Vallabhaneni
,
Ehsan Izadi
,
Carl R. Mayer
,
C. Shashank Kaira
,
Sudhanshu S. Singh
,
Jagannathan Rajagopalan
,
Nikhilesh Chawla
Microelectron. Reliab., 2017