1994
Potential Solutions for Benchmarking Issues.
[DOI]
Don Sterba
Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1991
ATPG and diagnostics for boards implementing boundary scan.
[DOI]
Don Sterba
,
Andy Halliday
,
Don McClean
J. Electron. Test., 1991

1990
ATPG issues for board designs implementing boundary scan.
[DOI]
Don Sterba
,
Andy Halliday
,
Don McClean
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990