A CMOS Threshold Voltage Monitoring Sensor.
Proceedings of the 12th International Conference on Modern Circuits and Systems Technologies, 2023
Variability of nanoscale triple gate FinFETs: Prediction and analysis method.
Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014
Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs.
Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012
Characteristics of double-gate polycrystalline silicon thin-film transistors for AMOLED pixel design.
Proceedings of the 17th IEEE International Conference on Electronics, 2010
Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.
Microelectron. Reliab., 2008
Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.
Microelectron. Reliab., 2006
Effects of hot carriers in offset gated polysilicon thin-film transistors.
Microelectron. Reliab., 2006