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2020
Cross-Project Defect Prediction via Semi-Supervised Discriminative Feature Learning.
[DOI]
Danlei Xing
,
Fei Wu
,
Ying Sun
,
Xiao-Yuan Jing
IEICE Trans. Inf. Syst., 2020
Adversarial Learning for Cross-Project Semi-Supervised Defect Prediction.
[DOI]
Ying Sun
,
Xiao-Yuan Jing
,
Fei Wu
,
Juanjuan Li
,
Danlei Xing
,
Haowen Chen
,
Yanfei Sun
IEEE Access, 2020