PEPR: Pseudo-Exhaustive Physically-Aware Region Testing.
Proceedings of the IEEE International Test Conference, 2022
Secuirty Metrics for Logic Circuits.
Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022
Characterizing Corruptibility of Logic Locks using ATPG.
Proceedings of the IEEE International Test Conference, 2021
Special Session: Novel Attacks on Logic-Locking.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
Characterization of Locked Combinational Circuits via ATPG.
Proceedings of the IEEE International Test Conference, 2019
Characterization of Locked Sequential Circuits via ATPG.
Proceedings of the IEEE International Test Conference in Asia, 2019