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2018
Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits.
[DOI]
Omar Al-Terkawi Hasib
,
Daniel Crepeau
,
Thomas Awad
,
Andrei Dulipovici
,
Yvon Savaria
,
Claude Thibeault
Proceedings of the 36th IEEE VLSI Test Symposium, 2018