2003
Short defect characterization based on TCR parameter extraction.
[DOI]
Abdellatif Firiti
,
D. Faujour
,
Gérald Haller
,
J. M. Moragues
,
Vincent Goubier
,
Philippe Perdu
,
Felix Beaudoin
,
Dean Lewis
Microelectron. Reliab., 2003