2023
Cognitive Risk Control for Physical-Layer RFID Counterfeit Tag Identification.
[DOI]
Haifeng Wu
,
Chongrong Pu
,
Wei Gao
,
Yu Zeng
IEEE Trans. Instrum. Meas., 2023

2022
Feature Selection and Cross Validation for Physical-Layer RFID Counterfeit Tag Identification.
[DOI]
Haifeng Wu
,
Wei Gao
,
Chongrong Pu
,
Yu Zeng
IEEE Trans. Instrum. Meas., 2022