Diagnosis technique for Clustered Multiple Transition Delay Faults.
Proceedings of the IEEE International Test Conference in Asia, 2020
Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips.
Proceedings of the 29th IEEE Asian Test Symposium, 2020
SCONN: Design and Implement Dual-Band Wireless Networking Assisted Fault Tolerant Data Transmission in Intelligent Buildings.
Proceedings of the 88th IEEE Vehicular Technology Conference, 2018