A Design of GS1 EPCglobal Application Level Events Extension for IoT Applications.
IEICE Trans. Inf. Syst., 2016
Adding IEEE 1451 Transducer Capability to EPCglobal Information Service.
Proceedings of the 2014 IEEE International Conference on Internet of Things, 2014
Extending EPCglobal ALE middleware to integrate transducer capability of IEEE 1451 standards.
Proceedings of the Sixth International Conference on Ubiquitous and Future Networks, 2014
A uniform EPC scheme design of IEEE 1451 transducers for IoT applications.
Proceedings of the Sixth International Conference on Ubiquitous and Future Networks, 2014
Complex sensing event process of IoT application based on epcglobal architecture and IEEE 1451.
Proceedings of the 3rd IEEE International Conference on the Internet of Things, 2012
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners.
IEEE Trans. Instrum. Meas., 2008
ELF-Murphy Data on Defects and Test Sets.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004
Experimental Results for Slow-Speed Testing.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
An Evaluation of Pseudo Random Testing for Detecting Real Defects.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
MINVDD Testing for Weak CMOS ICs.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
Multiple-output propagation transition fault test.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
Testing for resistive opens and stuck opens.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
Cold Delay Defect Screening.
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000
Stuck-fault tests vs. actual defects.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000
Experimental Results for IDDQ and VLV Testing.
Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998