Multiscale Profile Characterization Based on Atomic Force Microscopy.
IEEE Trans. Instrum. Meas., 2025
Mechano-Electrophysiological Signals Measuring System Based on Cantilevered Micropipette Force Electric Sensor.
IEEE Trans. Instrum. Meas., 2025
Peak Force Torsional Resonance Microscopy for Accurate Nanoscale Characterization of In-Plane and Out-of-Plane Mechanical Properties.
IEEE Trans Autom. Sci. Eng., 2025
High-Speed Near-Surface Tracking for Fast Atomic Force Microscope Scan Switching Based on the Squeeze Film Damping Effect.
IEEE Trans. Ind. Electron., February, 2024
AFM Vibration Noise Reduction via Squeeze-Film-Damping-Effect Sensing Method.
IEEE Trans. Instrum. Meas., 2024
Noncontact Subnanometer Resolution Displacement Sensing With Wide Bandwidth Based on Squeeze Film Damping Effect.
IEEE Trans. Instrum. Meas., 2023
Spatial Vibration and Displacement Measurement Through Single-Point Continuous and Interval Scanning Laser Doppler Vibrometer.
IEEE Trans. Instrum. Meas., 2023
Non-destructive Two-Dimensional Motion Measurement of Cardiomyocytes Based on Hough Transform.
Proceedings of the Intelligent Robotics and Applications - 15th International Conference, 2022
Theoretical Calculation and Analysis of Microdroplet Evaporation on Micropipette Force Sensor.
Proceedings of the Intelligent Robotics and Applications - 15th International Conference, 2022
Micro-nano Scale Longitudinal Displacement Measurement of Microspheres Based on Digital Holography.
Proceedings of the Intelligent Robotics and Applications - 14th International Conference, 2021
Rapid Broadband Discrete Nanomechanical Mapping on Atomic Force Microscope.
Proceedings of the 2019 American Control Conference, 2019
Adaptive Simultaneous Topography and Broadband Nanomechanical Mapping of Heterogeneous Materials on Atomic Force Microscope.
Proceedings of the 2019 American Control Conference, 2019
Motion controller for the Atomic Force Microscopy based nanomanipulation system.
Proceedings of the 2009 IEEE/RSJ International Conference on Intelligent Robots and Systems, 2009
A current cycle feedback iterative learning control approach to AFM imaging.
Proceedings of the American Control Conference, 2008
AFM image based pattern detection for adaptive drift compensation and positioning at the nanometer scale.
Proceedings of the American Control Conference, 2008
Iteration-based Scan-Trajectory Design and Control with Output-Oscillation Minimization: Atomic Force Microscope Example.
Proceedings of the American Control Conference, 2007
Atomic Force Microscopy Sensing Using Multiple Modes.
Proceedings of the 2006 IEEE/RSJ International Conference on Intelligent Robots and Systems, 2006