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2024
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET.
[DOI]
Taeyoung Kim
,
Suhwan Lim
,
Ilho Myeong
,
Sanghyun Park
,
Suseong Noh
,
Seung Min Lee
,
Jongho Woo
,
Hanseung Ko
,
Youngji Noh
,
Moonkang Choi
,
Kiheun Lee
,
Sangwoo Han
,
Jongyeon Baek
,
Kijoon Kim
,
Dongjin Jung
,
Jisung Kim
,
Jaewoo Park
,
Seunghyun Kim
,
Hyoseok Kim
,
Sijung Yoo
,
Hyun Jae Lee
,
Duk-Hyun Choe
,
Seung-Geol Nam
,
Ilyoung Yoon
,
Chaeho Kim
,
Kwanzsoo Kim
,
Kwanzmin Park
,
Bong Jin Kuh
,
Jinseong Heo
,
Wanki Kim
,
Daewon Ha
,
Jaihyuk Song
Proceedings of the IEEE International Reliability Physics Symposium, 2024