Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests.
Proceedings of the 22nd IEEE Interregional NEWCAS Conference, 2024
A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications.
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Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2024
40-nm RFSOI technology exhibiting 90fs RON × COFF and fT/fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications.
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Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
Fouille de traces de jeu vidéo en compétition. Une approche stratégique et sportive.
Ingénierie des Systèmes d Inf., 2012