IEEE Trans. Computers, 1974
Correction to "On the Application of Divergence for the Extraction of Features from Imperfectly Labeled Patterns".
IEEE Trans. Syst. Man Cybern., 1973
On feature extraction in pattern recognition.
Inf. Sci., 1973
On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns.
Int. J. Parallel Program., 1973
On the distance criterion of Patrick and Fischer (Corresp.).
IEEE Trans. Inf. Theory, 1972
On the Extraction of Pattern Features from Imperfectly Identified Samples.
IEEE Trans. Computers, 1972
An Algorithm for Pattern Classification Using Eigenvectors.
IEEE Trans. Computers, 1971