Reliability Characteristics of a High Density Metal- Insulator-Metal Capacitor on Intel's 10+ Process.
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Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
A Reliability Overview of Intel's 10+ Logic Technology.
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Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology.
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Proceedings of the IEEE International Reliability Physics Symposium, 2018