RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications.
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Proceedings of the IEEE International Reliability Physics Symposium, 2023
Robust Off-State TDDB Reliability of n-LDMOS.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications.
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Proceedings of the IEEE International Reliability Physics Symposium, 2021
Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics.
Proceedings of the Optical Fiber Communications Conference and Exhibition, 2020
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications.
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Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.
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Proceedings of the IEEE International Reliability Physics Symposium, 2019
Increasing Microprocessor Speed by Massive Application of On-Die High-K MIM Decoupling Capacitors.
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Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006