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1998
Cache RAM inductive fault analysis with fab defect modeling.
[DOI]
T. M. Mak
,
Debika Bhattacharya
,
Cheryl Prunty
,
Bob Roeder
,
Nermine Ramadan
,
F. Joel Ferguson
,
Jianlin Yu
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998