2022
Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited).
[DOI]
Shou-En Liu
,
Jian Li
,
Deepak Nayak
,
Amit Marathe
,
Kaushik Balamukundhan
,
Vishal Gosavi
,
Ajaykumar Prajapati
,
Baha Kilic
,
Mengzhi Pang
,
Arpit Mittal
Proceedings of the IEEE International Reliability Physics Symposium, 2022