2020
Internal I/O Testing: Definition and a Solution.
[DOI]
Sreejit Chakravarty
,
Fei Su
,
Indira A. Gohad
,
Sudheer V. Bandana
,
B. S. Adithya
,
Wei Ming Lim
Proceedings of the 38th IEEE VLSI Test Symposium, 2020