2025
FORTALESA: Fault-Tolerant Reconfigurable Systolic Array for DNN Inference.
CoRR, March, 2025
European Test Symposium Teams: an Anniversary Snapshot.
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Proceedings of the IEEE European Test Symposium, 2025
2024
Keynote: Cost-Efficient Reliability for Edge-AI Chips.
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Proceedings of the 25th IEEE Latin American Test Symposium, 2024
IJTAG-compatible Symptom-based SEU Monitors for FPGA DNN Accelerators.
Proceedings of the IEEE International Conference on Design, 2024
Structural Decision Diagrams in Digital Test - Theory and Applications
Springer, ISBN: 978-3-031-44733-4, 2024
2023
On-Chip Sensors Data Collection and Analysis for SoC Health Management.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
2022
HLS-based Optimization of Tau Triggering Algorithm for LHC: a case study.
CoRR, 2022
2019
IEEE European Test Symposium (ETS).
Proceedings of the IEEE International Test Conference, 2019
Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL.
Proceedings of the IEEE International Test Conference, 2019
Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks.
Proceedings of the 24th IEEE European Test Symposium, 2019
A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network.
Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019
2017
Run-time reconfigurable instruments for advanced board-level testing.
IEEE Instrum. Meas. Mag., 2017
Health Management for Self-Aware SoCs Based on IEEE 1687 Infrastructure.
IEEE Des. Test, 2017
Marginal PCB assembly defect detection on DDR3/4 memory bus.
Proceedings of the IEEE International Test Conference, 2017
BASTION: Board and SoC test instrumentation for ageing and no failure found.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures.
J. Electron. Test., 2016
On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs.
Proceedings of the 17th Latin-American Test Symposium, 2016
A suite of IEEE 1687 benchmark networks.
Proceedings of the 2016 IEEE International Test Conference, 2016
Designing reliable cyber-physical systems overview associated to the special session at FDL'16.
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Proceedings of the 2016 Forum on Specification and Design Languages, 2016
On coverage of timing related faults at board level.
Proceedings of the 21th IEEE European Test Symposium, 2016
2015
No Fault Found: The root cause.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
Virtual reconfigurable scan-chains on FPGAs for optimized board test.
Proceedings of the 16th Latin-American Test Symposium, 2015
2014
Asynchronous Fault Detection in IEEE P1687 Instrument Network.
Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014
Design, Verification, and Application of IEEE 1687.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
High Quality System Level Test and Diagnosis.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
2013
Effective Scalable IEEE 1687 Instrumentation Network for Fault Management.
IEEE Des. Test, 2013
On in-system programming of non-volatile memories.
Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013
2012
FPGA-based synthetic instrumentation for board test.
Proceedings of the 2012 IEEE International Test Conference, 2012
Embedded synthetic instruments for Board-Level testing.
Proceedings of the 17th IEEE European Test Symposium, 2012
Re-using chip level DFT at board level.
Proceedings of the 17th IEEE European Test Symposium, 2012
2011
Invited paper: System-wide fault management based on IEEE P1687 IJTAG.
Proceedings of the 6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip, 2011
SoC and Board Modeling for Processor-Centric Board Testing.
Proceedings of the 14th Euromicro Conference on Digital System Design, 2011
Automatic SoC Level Test Path Synthesis Based on Partial Functional Models.
Proceedings of the 20th IEEE Asian Test Symposium, 2011
2010
Structural fault collapsing by superposition of BDDs for test generation in digital circuits.
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010
Fault collapsing with linear complexity in digital circuits.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Testing beyond the SoCs in a lego style.
Proceedings of the 2010 East-West Design & Test Symposium, 2010
Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits.
Proceedings of the 13th Euromicro Conference on Digital System Design, 2010
Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Parallel X-fault simulation with critical path tracing technique.
Proceedings of the Design, Automation and Test in Europe, 2010
2009
Diagnozer: A laboratory tool for teaching research in diagnosis of electronic systems.
Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2009
Turning JTAG inside out for fast extended test access.
Proceedings of the 10th Latin American Test Workshop, 2009
Fast extended test access via JTAG and FPGAs.
Proceedings of the 2009 IEEE International Test Conference, 2009
Structurally synthesized multiple input BDDs for simulation of digital circuits.
Proceedings of the 16th IEEE International Conference on Electronics, 2009
2008
DefSim: A Remote Laboratory for Studying Physical Defects in CMOS Digital Circuits.
IEEE Trans. Ind. Electron., 2008
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols.
IET Comput. Digit. Tech., 2008
Reseeding using compaction of pre-generated LFSR sub-sequences.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, 2008
Calculation of LFSR Seed and Polynomial Pair for BIST Applications.
Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008
Parallel fault backtracing for calculation of fault coverage.
Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008
2007
Learning Digital Test and Diagnostics via Internet.
Int. J. Online Eng., 2007
Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs.
Proceedings of the 12th European Test Symposium, 2007
2006
DefSim: CMOS Defects on Chip for Research and Education.
Proceedings of the 7th Latin American Test Workshop, 2006
Fault Simulation with Parallel Critical Path Tracing for Combinatorial Circuits Using Structurally Synthesized BDDs.
Proceedings of the 7th Latin American Test Workshop, 2006
Off-Line Testing of Delay Faults in NoC Interconnects.
Proceedings of the Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2006), 30 August, 2006
2005
Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs.
Proceedings of the Dependable Computing, 2005
An Educational Environment for Digital Testing: Hardware, Tools, and Web-Based Runtime Platform.
Proceedings of the Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August, 2005
2004
At-speed on-chip diagnosis of board-level interconnect faults.
Proceedings of the 9th European Test Symposium, 2004
Asynchronous e-learning resources for hardware design issues.
Proceedings of the 5th International Conference on Computer Systems and Technologies, 2004
2002
Fast static compaction of tests composed of independent sequences: basic properties and comparison of methods.
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002
Practical works for on-line teaching design and test of digital circuits.
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002
2001
Timing simulation of digital circuits with binary decision diagrams.
Proceedings of the Conference on Design, Automation and Test in Europe, 2001