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2020
Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy.
[DOI]
Xiukun Hu
,
Gaoliang Dai
,
Sibylle Sievers
,
Alexander Fernández Scarioni
,
Volker Neu
,
Mark Bieler
,
Hans Werner Schumacher
IEEE Trans. Instrum. Meas., 2020