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2001
Fault Models and Test Procedures for Flash Memory Disturbances.
[DOI]
Mohammad Gh. Mohammad
,
Kewal K. Saluja
,
Alex S. Yap
J. Electron. Test., 2001
2000
Testing Flash Memories.
[DOI]
Mohammad Gh. Mohammad
,
Kewal K. Saluja
,
Alex S. Yap
Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000