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2018
Non-destructive imaging of defects in Ag-sinter die attach layers - A comparative study including X-ray, Scanning Acoustic Microscopy and Thermography.
[DOI]
Patrick Dreher
,
Roman Schmidt
,
A. Vetter
,
J. Hepp
,
Karl Aberer
,
Christoph J. Brabec
Microelectron. Reliab., 2018