2015
Metal fatigue in copper pillar Flip Chip BGA: A refined acceleration model for the aluminium pad cracking failure mechanism.
Microelectron. Reliab., 2015

2012
Read disturb on flash memories: Study on temperature annealing effect.
Microelectron. Reliab., 2012

2006
Read disturb in flash memories: reliability case.
Microelectron. Reliab., 2006

2002
Contact resistivity instability in embedded SRAM memory.
Microelectron. Reliab., 2002