2018
Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Ambient temperature and layout impact on self-heating characterization in FinFET devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
NBTI in Si0.5Ge0.5 RMG gate stacks - Effect of high-k nitridation.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Impact of RTN on stochastic BTI degradation in scaled metal gate/high-k CMOS technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2007
Reliability screening of high-k dielectrics based on voltage ramp stress.
Microelectron. Reliab., 2007

2006
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides.
Microelectron. Reliab., 2006