Atul Chittora
According to our database1,
Atul Chittora
authored at least 2 papers
between 2016 and 2017.
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Bibliography
2017
Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data.
Proceedings of the 26th IEEE Asian Test Symposium, 2017
2016
Proceedings of the 2016 IEEE International Test Conference, 2016