Atsushi Murakami

According to our database, Atsushi Murakami authored at least 4 papers between 1986 and 2000.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2000

On validating data hold times for flip-flops in sequential circuits.

Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara, Atsushi Murakami, Sadami Takeoka, Mitsuyasu Ohta

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Selection of potentially testable path delay faults for test generation.

Atsushi Murakami, Seiji Kajihara, Tsutomu Sasao, Irith Pomeranz, Sudhakar M. Reddy

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits.

Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1986

Testing for a Solid-State Color Image Sensor.

T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka

Proceedings of the Proceedings International Test Conference 1986, 1986