Atsushi Himeno

According to our database, Atsushi Himeno authored at least 4 papers between 2012 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.

Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda

Proceedings of the Symposium on VLSI Circuits, 2015

2013

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput.

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

IEEE J. Solid State Circuits, 2013

Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM.

Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Ryutaro Yasuhara, Shunsaku Muraoka, Atsushi Himeno, Naoki Yoshikawa, Hideaki Murase, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

Proceedings of the 2013 IEEE International Solid-State Circuits Conference, 2013

2012

An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput.

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda, Ken Kawai, Yoshikazu Katoh, Kouhei Tanabe, Toshihiro Nakamura, Yoshihiko Sumimoto, Naoki Yamada, Nobuyuki Nakai, Shoji Sakamoto, Yukio Hayakawa, Kiyotaka Tsuji, Shinichi Yoneda, Atsushi Himeno, Ken-ichi Origasa, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012