Atefe Dalirsani

According to our database, Atefe Dalirsani authored at least 12 papers between 2007 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip.

Gert Schley, Atefe Dalirsani, Marcus Eggenberger, Nadereh Hatami, Hans-Joachim Wunderlich, Martin Radetzki

IEEE Trans. Computers, 2017

2016

Functional Diagnosis for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Hans-Joachim Wunderlich

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

Self-diagnosis in Network-on-Chips.

Atefe Dalirsani

PhD thesis, 2015

Intermittent and Transient Fault Diagnosis on Sparse Code Signatures.

Michael A. Kochte, Atefe Dalirsani, Andrea Bernabei, Martin Omaña, Cecilia Metra, Hans-Joachim Wunderlich

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

Structural Software-Based Self-Test of Network-on-Chip.

Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Area-efficient synthesis of fault-secure NoC switches.

Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

On Covering Structural Defects in NoCs by Functional Tests.

Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

SAT-based code synthesis for fault-secure circuits.

Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

Structural Test and Diagnosis for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

J. Electron. Test., 2012

2011

Structural Test for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the 16th European Test Symposium, 2011

2007

An Analytical Model for Reliability Evaluation of NoC Architectures.

Atefe Dalirsani, Mohammad Hosseinabady, Zainalabedin Navabi

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Using the inter- and intra-switch regularity in NoC switch testing.

Mohammad Hosseinabady, Atefe Dalirsani, Zainalabedin Navabi

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007