Aswin Sreedhar

According to our database, Aswin Sreedhar authored at least 14 papers between 2007 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of two.

2012

On Reliability Trojan Injection and Detection.

Aswin Sreedhar, Sandip Kundu, Israel Koren

J. Low Power Electron., 2012

2011

On discovery of "missing" physical design rules via diagnosis of soft-faults.

Aswin Sreedhar, Sandip Kundu

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

Physically unclonable functions for embeded security based on lithographic variation.

Aswin Sreedhar, Sandip Kundu

Proceedings of the Design, Automation and Test in Europe, 2011

On design of test structures for lithographic process corner identification.

Aswin Sreedhar, Sandip Kundu

Proceedings of the Design, Automation and Test in Europe, 2011

Modeling manufacturing process variation for design and test.

Sandip Kundu, Aswin Sreedhar

Proceedings of the Design, Automation and Test in Europe, 2011

2010

TURBONFS: turbo nand flash search.

Shruti Vyas, Aswin Sreedhar, Sandip Kundu

Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, 2010

2009

Statistical timing analysis based on simulation of lithographic process.

Aswin Sreedhar, Sandip Kundu

Proceedings of the 27th International Conference on Computer Design, 2009

Optical lithography simulation using wavelet transform.

Rance Rodrigues, Aswin Sreedhar, Sandip Kundu

Proceedings of the 27th International Conference on Computer Design, 2009

On linewidth-based yield analysis for nanometer lithography.

Aswin Sreedhar, Sandip Kundu

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Lithography Simulation Basics and a Study on Impact of Lithographic Process Window on Gate and Path Delays.

Aswin Sreedhar, Sandip Kundu

J. Low Power Electron., 2008

Statistical Yield Modeling for Sub-wavelength Lithography.

Aswin Sreedhar, Sandip Kundu

Proceedings of the 2008 IEEE International Test Conference, 2008

Modeling and analysis of non-rectangular transistors caused by lithographic distortions.

Aswin Sreedhar, Sandip Kundu

Proceedings of the 26th International Conference on Computer Design, 2008

On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.

Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu

Proceedings of the Design, Automation and Test in Europe, 2008

2007

On modeling impact of sub-wavelength lithography on transistors.

Aswin Sreedhar, Sandip Kundu

Proceedings of the 25th International Conference on Computer Design, 2007