Arunkumar Vijayan

According to our database, Arunkumar Vijayan authored at least 12 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2022

A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems.

Arunkumar Vijayan, Mehdi B. Tahoori, Ewald Kintzli, Timm Lohmann, Juergen Hans Handl

Proceedings of the IEEE European Test Symposium, 2022

2020

Runtime Identification of Hardware Trojans by Feature Analysis on Gate-Level Unstructured Data and Anomaly Detection.

Arunkumar Vijayan, Mehdi B. Tahoori, Krishnendu Chakrabarty

ACM Trans. Design Autom. Electr. Syst., 2020

Dynamic Faults based Hardware Trojan Design in STT-MRAM.

Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Runtime Monitoring for Dependable Hardware Design.

Arunkumar Vijayan

PhD thesis, 2019

2018

Workload-Aware Static Aging Monitoring and Mitigation of Timing-Critical Flip-Flops.

Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress.

Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Online Soft-Error Vulnerability Estimation for Memory Arrays and Logic Cores.

Arunkumar Vijayan, Saman Kiamehr, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017

Workload-aware static aging monitoring of timing-critical flip-flops.

Arunkumar Vijayan, Saman Kiamehr, Fabian Oboril, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

Online soft-error vulnerability estimation for memory arrays.

Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Self-awareness and self-learning for resiliency in real-time systems.

Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure.

Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2015

Re-using BIST for circuit aging monitoring.

Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori

Proceedings of the 20th IEEE European Test Symposium, 2015