Arturo J. Fernández

Orcid: 0000-0003-2646-0905

According to our database¹, Arturo J. Fernández authored at least 33 papers between 2006 and 2023.

Collaborative distances:

Dijkstra number² of six.
Erdős number³ of five.

Timeline

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In proceedings

Article

PhD thesis

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Bibliography

2023

Overdispersion Effects on Reliability Test Planning.

[BibT_eX]

[DOI]

Arturo J. Fernández

Carlos J. Pérez-González

Andrés Carrión-García

Vicent Giner-Bosch

IEEE Trans. Reliab., September, 2023

Optimal repetitive reliability inspection of manufactured lots for lifetime models using prior information.

[BibT_eX]

[DOI]

Carlos J. Pérez-González

Arturo J. Fernández

Vicent Giner-Bosch

Andrés Carrión-García

Int. J. Prod. Res., April, 2023

Tolerance Limits and Sample-Size Determination Using Weibull Trimmed Data.

[BibT_eX]

[DOI]

Arturo J. Fernández

Axioms, April, 2023

Optimum lot inspection based on lognormal reliability tests.

[BibT_eX]

[DOI]

Arturo J. Fernández

Int. J. Prod. Res., March, 2023

Optimal Confidence Regions for Weibull Parameters and Quantiles under Progressive Censoring.

[BibT_eX]

[DOI]

Arturo J. Fernández

Algorithms, 2023

2022

Gamma Reliability Test Times With Minimal Costs and Limited Risks.

[BibT_eX]

[DOI]

Arturo J. Fernández

IEEE Trans. Reliab., 2022

Joint Prediction for Future Failures Times Under Type-II Censoring.

[BibT_eX]

[DOI]

S. F. Bagheri

Akbar Asgharzadeh

Arturo J. Fernández

Carlos J. Pérez-González

IEEE Trans. Reliab., 2022

Planning reliability demonstration tests with limited expected risks.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Ind. Eng., 2022

Enhanced Lot Acceptance Testing Based on Defect Counts and Posterior Odds Ratios.

[BibT_eX]

[DOI]

Arturo J. Fernández

Axioms, 2022

2021

Optimal lot sentencing based on defective counts and prior acceptability.

[BibT_eX]

[DOI]

Arturo J. Fernández

Carlos J. Pérez-González

M. Mercedes Suárez-Rancel

J. Comput. Appl. Math., 2021

Optimal durations of Weibull reliability tests based on failure counts.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Ind. Eng., 2021

2020

Efficient truncated repetitive lot inspection using Poisson defect counts and prior information.

[BibT_eX]

[DOI]

Carlos J. Pérez-González

Arturo J. Fernández

Akram Kohansal

Eur. J. Oper. Res., 2020

Balancing producer and consumer risks in optimal attribute testing: A unified Bayesian/Frequentist design.

[BibT_eX]

[DOI]

Arturo J. Fernández

Cristian D. Correa-Álvarez

Luis R. Pericchi

Eur. J. Oper. Res., 2020

Explicit lot inspection by attributes using minimal prior information.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Ind. Eng., 2020

2019

Improved time-censored reliability test plans for k-out-of-n gamma systems.

[BibT_eX]

[DOI]

Arturo J. Fernández

Carlos J. Pérez-González

Akram Kohansal

J. Comput. Appl. Math., 2019

Optimal attribute sampling plans in closed-forms.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Ind. Eng., 2019

2017

Economic lot sampling inspection from defect counts with minimum conditional value-at-risk.

[BibT_eX]

[DOI]

Arturo J. Fernández

Eur. J. Oper. Res., 2017

2015

Optimum attributes component test plans for k-out-of-n: F Weibull systems using prior information.

[BibT_eX]

[DOI]

Arturo J. Fernández

Eur. J. Oper. Res., 2015

Optimal schemes for resubmitted lot acceptance using previous defect count data.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Ind. Eng., 2015

2014

Optimal Defects-Per-Unit Acceptance Sampling Plans Using Truncated Prior Distributions.

[BibT_eX]

[DOI]

Arturo J. Fernández

IEEE Trans. Reliab., 2014

Computing optimal confidence sets for Pareto models under progressive censoring.

[BibT_eX]

[DOI]

Arturo J. Fernández

J. Comput. Appl. Math., 2014

2013

Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis.

[BibT_eX]

[DOI]

Carlos J. Pérez-González

Arturo J. Fernández

Comput. Stat., 2013

Smallest Pareto confidence regions and applications.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Stat. Data Anal., 2013

2012

Generalized beta prior models on fraction defective in reliability test planning.

[BibT_eX]

[DOI]

Arturo J. Fernández

Carlos J. Pérez-González

J. Comput. Appl. Math., 2012

Minimizing the area of a Pareto confidence region.

[BibT_eX]

[DOI]

Arturo J. Fernández

Eur. J. Oper. Res., 2012

Optimal acceptance sampling plans for log-location-scale lifetime models using average risks.

[BibT_eX]

[DOI]

Arturo J. Fernández

Carlos J. Pérez-González

Comput. Stat. Data Anal., 2012

2011

Optimal Reliability Demonstration Test Plans for $k$-out-of-$n$ Systems of Gamma Distributed Components.

[BibT_eX]

[DOI]

Arturo J. Fernández

IEEE Trans. Reliab., 2011

Design of progressively censored group sampling plans for Weibull distributions: An optimization problem.

[BibT_eX]

[DOI]

Arturo J. Fernández

Carlos J. Pérez-González

Muhammad Aslam

Chi-Hyuck Jun

Eur. J. Oper. Res., 2011

2010

Tolerance Limits for k -Out-of- n Systems With Exponentially Distributed Component Lifetimes.

[BibT_eX]

[DOI]

Arturo J. Fernández

IEEE Trans. Reliab., 2010

Two-sided tolerance intervals in the exponential case: Corrigenda and generalizations.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Stat. Data Anal., 2010

2008

Reliability inference and sample-size determination under double censoring for some two-parameter models.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Stat. Data Anal., 2008

2006

Bounding maximum likelihood estimates based on incomplete ordered data.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Stat. Data Anal., 2006

Bayesian estimation based on trimmed samples from Pareto populations.

[BibT_eX]

[DOI]

Arturo J. Fernández

Comput. Stat. Data Anal., 2006

Arturo J. Fernández

Timeline

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