Art Witulski

According to our database, Art Witulski authored at least 2 papers in 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2007

Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM.

Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology.

Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski

Proceedings of the 17th ACM Great Lakes Symposium on VLSI 2007, 2007