Arno Kunzmann

According to our database1, Arno Kunzmann authored at least 16 papers between 1988 and 1998.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

1998
Advantages of the XC6000 Architecture for Embedded System Design (Abstract).
Proceedings of the 1998 ACM/SIGDA Sixth International Symposium on Field Programmable Gate Arrays, 1998

Analysis of the XC6000 Architecture for Embedded System Design.
Proceedings of the 6th IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM '98), 1998

Verification by Simulation Comparison using Interface Synthesis.
Proceedings of the 1998 Design, 1998

1997
Performance analysis for a Java-based virtual prototype.
Proceedings of the Proceedings 8th IEEE International Workshop on Rapid System Prototyping: Shortening the Path from Specification to Prototype, 1997

1996
Efficient random testing with global weights.
Proceedings of the conference on European design automation, 1996

1995
Reduced design time by load distribution with CAD framework methodology information.
Proceedings of the Proceedings EURO-DAC'95, 1995

Generic design flows for project management in a framework environment.
Proceedings of the 1995 European Design and Test Conference, 1995

Enhanced functionality by coupling the JESSI-COMMON-Framework with an ECAD framework.
Proceedings of the 1995 European Design and Test Conference, 1995

1994
Self-test of sequential circuits with deterministic test pattern sequences.
J. Electron. Test., 1994

Gate-Delay Fault Test with Conventional Scan-Design.
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994

Test pattern generation hardware motivated by pseudo-exhaustive test techniques.
Proceedings of the Proceedings EURO-DAC'94, 1994

1992
FPL Based Self-Test with Deterministic Test Patterns.
Proceedings of the Field-Programmable Gate Arrays: Architectures and Tools for Rapid Prototyping, Second International Workshop on Field-Programmable Logic and Applications, Vienna, Austria, August 31, 1992

Generation of deterministic test patterns by minimal basic test sets.
Proceedings of the conference on European design automation, 1992

1990
An analytical approach to the partial scan problem.
J. Electron. Test., 1990

1989
Test synchroner Schaltwerke auf der Basis partieller Prüfpfade.
PhD thesis, 1989

1988
Produktionstest synchroner Schaltwerke auf der Basis von Pipelinestrukturen.
Proceedings of the GI, 1988


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