Argyrios T. Hatzopoulos

According to our database, Argyrios T. Hatzopoulos authored at least 6 papers between 2006 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation.

Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Dimitrios K. Papakostas

Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024

Liquid Filling Measuring System with Variable Flow.

Nikisanlis Nikolaos, Argyrios T. Hatzopoulos, Vassilios D. Vassios, Vasileios Delimaras, Kyriakos Tsiakmakis, Maria S. Papadopoulou

Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024

Web-Based Monitoring of Refrigerator Units Using Microcontroller.

Nikolaos Chatzilabrou, Kyriakos Koritsoglou, Aikaterini I. Griva, Vassilios D. Vassios, Kyriakos Tsiakmakis, Achilles D. Boursianis, Argyrios T. Hatzopoulos, Sotirios K. Goudos, Maria S. Papadopoulou

Proceedings of the 13th International Conference on Modern Circuits and Systems Technologies, 2024

2008

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.

N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos

Microelectron. Reliab., 2008

2006

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.

Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

Effects of hot carriers in offset gated polysilicon thin-film transistors.

Argyrios T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006