Anuja Sehgal

Affiliations:
  • NVidia
  • AMD (former)
  • Duke University, Durham, NC, USA (former)


According to our database1, Anuja Sehgal authored at least 17 papers between 2003 and 2009.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2009
Testing of SoCs with Hierarchical Cores: Common Fallacies, Test Access Optimization, and Test Scheduling.
IEEE Trans. Computers, 2009

Test Data Volume Comparison: Monolithic vs. Modular SoC Testing.
IEEE Des. Test Comput., 2009

2008
Power-aware SoC test planning for effective utilization of port-scalable testers.
ACM Trans. Design Autom. Electr. Syst., 2008

Test Access Mechanism for Multiple Identical Cores.
Proceedings of the 2008 IEEE International Test Conference, 2008

2007
Optimization of Dual-Speed TAM Architectures for Efficient Modular Testing of SOCs.
IEEE Trans. Computers, 2007

Test cost reduction for the AMD™ Athlon processor using test partitioning.
Proceedings of the 2007 IEEE International Test Conference, 2007

2006
Test infrastructure design for mixed-signal SOCs with wrapped analog cores.
IEEE Trans. Very Large Scale Integr. Syst., 2006

Hierarchy-aware and area-efficient test infrastructure design for core-based system chips.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs.
Proceedings of the 23rd International Conference on Computer Design (ICCD 2005), 2005

Test planning for the effective utilization of port-scalable testers for heterogeneous core-based SOCs.
Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores.
Proceedings of the 2005 Design, 2005

2004
SOC test planning using virtual test access architectures.
IEEE Trans. Very Large Scale Integr. Syst., 2004

IEEE P1500-Compliant Test Wrapper Design for Hierarchical Cores.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures.
Proceedings of the 2004 Design, 2004

2003
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers.
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

Yield analysis for repairable embedded memories.
Proceedings of the 8th European Test Workshop, 2003

Test cost reduction for SOCs using virtual TAMs and lagrange multipliers.
Proceedings of the 40th Design Automation Conference, 2003


  Loading...