Antonios Pavlidis

According to our database, Antonios Pavlidis authored at least 8 papers between 2020 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Digital-to-Analog Hardware Trojan Attacks.

Mohamed Elshamy, Giorgio Di Natale, Alhassan Sayed, Antonios Pavlidis, Marie-Minerve Louërat, Hassan Aboushady, Haralampos-G. Stratigopoulos

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs.

Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure.

Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos

Proceedings of the IEEE International Test Conference, 2022

2021

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety.

Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. Stratigopoulos

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

BIST-Assisted Analog Fault Diagnosis.

Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Spiking Neuron Hardware-Level Fault Modeling.

Sarah A. El-Sayed, Theofilos Spyrou, Antonios Pavlidis, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. D. Stratigopoulos

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism.

Mohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos

Proceedings of the IEEE European Test Symposium, 2020

Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP.

Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. D. Stratigopoulos

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020