Anthony P. Ambler

According to our database, Anthony P. Ambler authored at least 24 papers between 1984 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System.

Lftikhar Khan, Taikyeong T. Jeong, Gyung-Leen Park, Anthony P. Ambler

Proceedings of the 10th ACIS International Conference on Software Engineering, 2009

2006

Behavioral Test Economics.

Scott Davidson, Anthony P. Ambler, Helen Davidson

Proceedings of the 2006 IEEE International Test Conference, 2006

Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System.

Taikyeong T. Jeong, Anthony P. Ambler

Proceedings of the Computational Science and Its Applications, 2006

2005

Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set.

Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume.

Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

2002

System Manufacturing Test Cost Model.

David Williams, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Is It Rocket Science?

Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

From DFT to systems test - a model based cost optimization tool.

Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman

Proceedings of the Conference on Design, Automation and Test in Europe, 2001

1997

The Economics of System-Level Testing.

Des Farren, Anthony P. Ambler

IEEE Des. Test Comput., 1997

1995

Cost-Effective System-Level Test Strategies.

Des Farren, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Sensitivity analysis in economics based test strategy planning.

J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler

J. Electron. Test., 1994

Test strategy planning using economic analysis.

I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick

J. Electron. Test., 1994

System Test Cost Modelling Based on Event Rate Analysis.

Des Farren, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222.

Anthony P. Ambler

Microprocess. Microsystems, 1993

Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards.

Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Algorithms for Cost Optimised Test Strategy Selection.

Chryssa Dislis, J. H. Dick, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Economics in Design and Test.

Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick

Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

1992

A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits.

Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

Economic Effects in Design and Test.

I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick

IEEE Des. Test Comput., 1991

1989

Cost Analysis of Test Method Environments.

Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler

Proceedings of the Proceedings International Test Conference 1989, 1989

1988

Estimation of area and performance overheads for testable VLSI circuits.

J. R. Miles, Anthony P. Ambler, K. A. E. Totton

Proceedings of the Computer Design: VLSI in Computers and Processors, 1988

1986

Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI.

Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear

Proceedings of the Proceedings International Test Conference 1986, 1986

1984

An Analysis of the Economics of Self Test.

Prab Varma, Anthony P. Ambler, Keith Baker

Proceedings of the Proceedings International Test Conference 1984, 1984

Ultimate: A hardware logic simulation engine.

M. E. Glazier, Anthony P. Ambler

Proceedings of the 21st Design Automation Conference, 1984