Anthony J. Walton

Orcid: 0000-0002-8110-2230

According to our database1, Anthony J. Walton authored at least 18 papers between 1992 and 2018.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2018
A Microelectrode Array with Reproducible Performance Shows Loss of Consistency Following Functionalization with a Self-Assembled 6-Mercapto-1-hexanol Layer.
Sensors, 2018

2017
Investigating the durability of electrochemical sensors for molten salts.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017

CMOS current attenuator for electrochemical sensing applications.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017

Polydimethylsiloxane (PDMS)-based microfluidic channel with integrated commercial pressure sensors.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017

2014
Integrated Magnetic MEMS Relays: Status of the Technology.
Micromachines, 2014

2010
Multi-Factorial Analysis of Class Prediction Error: Estimating Optimal Number of Biomarkers for Various Classification Rules.
J. Bioinform. Comput. Biol., 2010

2008
Reconfigurable MEMS Antennas.
Proceedings of the NASA/ESA Conference on Adaptive Hardware and Systems, 2008

2006
ESPACENET: A Framework of Evolvable and Reconfigurable Sensor Networks for Aerospace-Based Monitoring and Diagnostics.
Proceedings of the First NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2006), 2006

2004
Modelling of binary phase modulation in surface stabilized ferroelectric liquid crystal spatial light modulators.
Microelectron. J., 2004

2003
Direct measurement of residual stress in integrated circuit interconnect features.
Microelectron. Reliab., 2003

1999
Efficient extra material critical area algorithms.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1997
Efficient critical area estimation for arbitrary defect shapes.
Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

1996
Integration of DFM Techniques and Design Automation.
Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

Yield Prediction by Sampling with the EYES Tool.
Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

1995
Critical area extraction of extra material soft faults.
Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

Hierarchical critical area extraction with the EYE tool.
Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

1994
Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies.
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1994

1992
A yield improvement technique for IC layout using local design rules.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992


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