Ansh

According to our database1, Ansh authored at least 4 papers between 2020 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

Legend:

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Links

On csauthors.net:

Bibliography

2023
Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2020
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight.
Proceedings of the 2020 Device Research Conference, 2020


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