Anne Meixner

According to our database, Anne Meixner authored at least 9 papers between 1991 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

An IDDQ BIST approach to characterize phase-locked loop parameters.

Samed Maltabas, Osman Kubilay Ekekon, Kemal Kulovic, Anne Meixner, Martin Margala

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2012

Improving IO test and system evaluation via data sharing.

Anne Meixner, Salem Abdennadher

Proceedings of the 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2012

2011

An industrial case study of analog fault modeling.

Ender Yilmaz, Anne Meixner, Sule Ozev

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

2008

External Loopback Testing Experiences with High Speed Serial Interfaces.

Anne Meixner, Akira Kakizawa, Benoit Provost, Serge Bedwani

Proceedings of the 2008 IEEE International Test Conference, 2008

2004

Testing Gbps Interfaces without a Gigahertz Tester.

T. M. Mak, Mike Tripp, Anne Meixner

IEEE Des. Test Comput., 2004

Design considerations and DFT to enable testing of digital interfaces.

Mike Tripp, T. M. Mak, Anne Meixner

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2003

Elimination of Traditional Functional Testing of Interface Timings at Intel.

Mike Tripp, T. M. Mak, Anne Meixner

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

1997

Weak Write Test Mode: An SRAM Cell Stability Design for Test Technique.

Anne Meixner, Jash Banik

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1991

Fault Modeling for the Testing of Mixed Integrated Circuits.

Anne Meixner, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991