Ann M. Rahn

According to our database, Ann M. Rahn authored at least 2 papers in 2006.

Collaborative distances:

• Dijkstra number of seven.
• Erdős number of five.

2006

Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237].

Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell

Microelectron. Reliab., 2006

Determining factors affecting ESD failure voltage using DOE.

Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell

Microelectron. Reliab., 2006