Ann-Christin Bette

According to our database, Ann-Christin Bette authored at least 4 papers between 2022 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2023

Counterfeit Detection by Semiconductor Process Technology Inspection.

Matthias Ludwig, Ann-Christin Bette, Bernhard Lippmann, Georg Sigl

Proceedings of the IEEE European Test Symposium, 2023

2022

Automated Defect Inspection in Reverse Engineering of Integrated Circuits.

Ann-Christin Bette, Patrick Brus, Gábor Balázs, Matthias Ludwig, Alois C. Knoll

Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2022

Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images.

Matthias Pollach, Felix Schiegg, Matthias Ludwig, Ann-Christin Bette, Alois C. Knoll

Proceedings of the 30th European Signal Processing Conference, 2022

Physical and Functional Reverse Engineering Challenges for Advanced Semiconductor Solutions.

Bernhard Lippmann, Ann-Christin Bette, Matthias Ludwig, Johannes Mutter, Johanna Baehr, Alexander Hepp, Horst A. Gieser, Nicola Kovac, Tobias Zweifel, Martin Rasche, Oliver Kellermann

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022