Ankush Srivastava
Orcid: 0000-0002-7894-3952
According to our database1,
Ankush Srivastava
authored at least 8 papers
between 2010 and 2022.
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Bibliography
2022
Proceedings of the IEEE International Test Conference, 2022
2020
J. Electron. Test., 2020
2019
Proceedings of the 32nd International Conference on VLSI Design and 18th International Conference on Embedded Systems, 2019
2017
J. Electron. Test., 2017
Proceedings of the 18th IEEE Latin American Test Symposium, 2017
Exploiting path delay test generation to develop better TDF tests for small delay defects.
Proceedings of the IEEE International Test Conference, 2017
2012
User Interface Design for Research Integrative Query (ResearchIQ)- An Ontology-anchored Interactive Query Tool.
Proceedings of the AMIA 2012, 2012
2010
Proceedings of the 2011 IEEE International Test Conference, 2010