Ankan K. Pramanick

According to our database1, Ankan K. Pramanick authored at least 15 papers between 1988 and 2005.

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Bibliography

2005
Parallel, multi-DUT testing in an open architecture test system.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004
Test Programming Environment in a Modular, Open Architecture Test System.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Software development for an open architecture test system.
Proceedings of the 9th European Test Symposium, 2004

1997
On the fault coverage of gate delay fault detecting tests.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

1995
Efficient multiple path propagating tests for delay faults.
J. Electron. Test., 1995

Parallel Delay Fault Coverage and Test Quality Evaluation.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994
Distributed Solutions to the Delay Fault Test Quality Evaluation Problem.
Proceedings of the Third International Symposium on High Performance Distributed Computing, 1994

1993
Testability preserving Boolean transforms for logic synthesis.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

On Unified Delay Fault Testing.
Proceedings of the Sixth International Conference on VLSI Design, 1993

Design of Scan-Based Path-Delay-Testable Sequential Circuits.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1991
On Multiple Path Propagating Tests for Path Delay Faults.
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990
On the design of path delay fault testable combinational circuits.
Proceedings of the 20th International Symposium on Fault-Tolerant Computing, 1990

On the fault coverage of delay fault detecting tests.
Proceedings of the European Design Automation Conference, 1990

1989
On the computation of the ranges of detected delay fault sizes.
Proceedings of the 1989 IEEE International Conference on Computer-Aided Design, 1989

1988
On the Detection of Delay Faults.
Proceedings of the Proceedings International Test Conference 1988, 1988


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