Andrzej Hlawiczka

According to our database1, Andrzej Hlawiczka authored at least 23 papers between 1978 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2010
Reduced-size signature-based diagnostic dictionary for interconnection testing.
Proceedings of the 10th IFAC Workshop on Programmable Devices and Embedded Systems, 2010

How to reduce size of a signature-based diagnostic dictionary used for testing of connections.
Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2010

2009
Effective BIST for crosstalk faults in interconnects.
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2009

2008
Interconnect Faults Identification and Localization Using Modified Ring LFSRs.
Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), 2008

2007
Test Pattern Generator for Delay Faults.
Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

Avoiding Crosstalk Influence on Interconnect Delay Fault Testing.
Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

2006
Test-per-Clock Detection, Localization and Identification of Interconnect Faults.
Proceedings of the 11th European Test Symposium, 2006

Detection, Localisation and Identification of Interconnection Faults Using MISR Compactor.
Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), 2006

2004
Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor.
J. Electron. Test., 2004

2002
Efficient test pattern generators based on specific cellular automata structures.
Microelectron. Reliab., 2002

Dependable testing of compactor MISR: an imperceptible problem?
Proceedings of the 7th European Test Workshop, 2002

2000
Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path.
Proceedings of the 5th European Test Workshop, 2000

Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata.
Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999
A New LFSR with D and T Flip-Flops as an Effective Test Pattern Generator for VLSI Circuits.
Proceedings of the Dependable Computing, 1999

1997
A linear code-preserving signature analyzer COPMISR.
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Low Cost Bist for Edac Circuits.
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1994
Optimized Synthesis of Self-Testable Finite State Machines (FSM) Using BIST-PST Structures in Altera Structures.
Proceedings of the Field-Programmable Logic, 1994

1992
Parallel Signature Analyzers Using Hybrid Design of Their Linear Feedbacks.
IEEE Trans. Computers, 1992

1989
Signature Analysis Testing with Bottom-Top Exclusive Or Type MISR.
Proceedings of the Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 1989

1987
Universal Test Controller Chip for Board Self Test.
Proceedings of the Fehlertolerierende Rechensysteme / Fault-Tolerant Computing Systems, 1987

1986
Compression of Three-State Data Serial Streams by Means of a Parallel LFSR Signature Analyzer.
IEEE Trans. Computers, 1986

1984
Compression of multiple-valued data serial streams by means of parallel LFSR signature analyzer.
Proceedings of the Fehlertolerierende Rechensysteme, 1984

1978
Comments on "Procedures for Eliminating Static and Dynamic-Hazards in Test Generation".
IEEE Trans. Computers, 1978


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