Andrew D. Koffman

According to our database, Andrew D. Koffman authored at least 10 papers between 2000 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Four Terminal-Pair Measurements of Ceramic Capacitors.

Stephan Schlamminger, J. Love, Andrew D. Koffman, Y. Wang

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

2023

Measurement of the Frequency Dependence of Four Terminal-Pair Air Capacitors With a Vector Network Analyzer.

Stephan Schlamminger, Andrew D. Koffman, James W. Schmidt, Bryan C. Waltrip, Yicheng Wang

IEEE Trans. Instrum. Meas., 2023

2022

Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge.

Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang

IEEE Trans. Instrum. Meas., 2022

2020

Using a Natural Ratio to Compare DC and AC Resistances.

Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee

IEEE Trans. Instrum. Meas., 2020

2017

Nonlinearity Testing of Capacitance Bridges Using Programmable Capacitors.

Yinan Yu, Andrew D. Koffman, Yicheng Wang

IEEE Trans. Instrum. Meas., 2017

2007

Dissipation Factors of Fused-Silica Capacitors in the Audio Frequency Range.

Yicheng Wang, Andrew D. Koffman, Gerald J. FitzPatrick

IEEE Trans. Instrum. Meas., 2007

Evaluation of a Capacitance Scaling System.

Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang

IEEE Trans. Instrum. Meas., 2007

2003

Improved 1-kHz capacitance calibration uncertainty.

Anne-Marie Jeffery, Andrew D. Koffman

IEEE Trans. Instrum. Meas., 2003

2000

Uncertainty analysis for four terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz.

Andrew D. Koffman, Svetlana Avramov-Zamurovic, Bryan Cristopher Waltrip, Nile M. Oldham

IEEE Trans. Instrum. Meas., 2000

The sensitivity of a method to predict a capacitor's frequency characteristic.

Svetlana Avramov-Zamurovic, Andrew D. Koffman, Nile M. Oldham, Bryan Cristopher Waltrip

IEEE Trans. Instrum. Meas., 2000