Andres F. Gomez

According to our database, Andres F. Gomez authored at least 14 papers between 2015 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects.

Andres F. Gomez, Víctor H. Champac

J. Electron. Test., 2019

2018

Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations Effects.

Andres F. Gomez, Víctor H. Champac

ACM Trans. Design Autom. Electr. Syst., 2018

Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations.

Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac

Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018

Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection.

Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy

Proceedings of the VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms, 2018

A metric-guided gate-sizing methodology for aging guardband reduction.

Andres F. Gomez, Roberto Gómez, Víctor H. Champac

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2016

Early Selection of Critical Paths for Reliable NBTI Aging-Delay Monitoring.

Andres F. Gomez, Víctor H. Champac

IEEE Trans. Very Large Scale Integr. Syst., 2016

Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations.

Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas

Microelectron. Reliab., 2016

Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.

Freddy Forero, Andres F. Gomez, Víctor H. Champac

J. Low Power Electron., 2016

A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage.

Freddy Forero, Andres F. Gomez, Víctor H. Champac

Proceedings of the 17th Latin-American Test Symposium, 2016

Critical path selection under NBTI/PBTI aging for adaptive frequency tuning.

Andres F. Gomez, Víctor H. Champac

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging.

Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging.

Andres F. Gomez, Víctor H. Champac

Proceedings of the 2015 IFIP/IEEE International Conference on Very Large Scale Integration, 2015

Circuit performance optimization for local intra-die process variations using a gate selection metric.

Víctor H. Champac, Alejandra Nicte-ha Reyes, Andres F. Gomez

Proceedings of the 2015 IFIP/IEEE International Conference on Very Large Scale Integration, 2015

Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability.

Andres F. Gomez, Víctor H. Champac

Proceedings of the 16th Latin-American Test Symposium, 2015