Andreas Glowatz
Orcid: 0000-0002-8086-6220
According to our database1,
Andreas Glowatz
authored at least 26 papers
between 2005 and 2024.
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On csauthors.net:
Bibliography
2024
A Cell-aware Transistor State Stress Model and its Application for Quality Measurement.
Proceedings of the IEEE International Test Conference, 2024
2023
Measuring Non-Redundant VIA Test-Coverage for Automotive Designs in Lower Process Nodes.
Proceedings of the IEEE International Test Conference, 2023
2022
IEEE Des. Test, 2022
2021
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021
Proceedings of the 30th IEEE Asian Test Symposium, 2021
2018
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies.
Proceedings of the IEEE International Test Conference, 2018
2014
Proceedings of the 19th IEEE European Test Symposium, 2014
2013
Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013
2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 15th Euromicro Conference on Digital System Design, 2012
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012
2011
Cell-aware analysis for small-delay effects and production test results from different fault models.
Proceedings of the 2011 IEEE International Test Conference, 2011
2010
J. Electron. Test., 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
2009
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the 10th Latin American Test Workshop, 2009
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008
2007
Proceedings of the 5th ACM & IEEE International Conference on Formal Methods and Models for Co-Design (MEMOCODE 2007), May 30, 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
Proceedings of the 37th International Symposium on Multiple-Valued Logic, 2007
Proceedings of the 12th European Test Symposium, 2007
2006
Fault detection and diagnosis with parity trees for space compaction of test responses.
Proceedings of the 43rd Design Automation Conference, 2006
2005
Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005